MS 4006-0

Brief

材料分析為各領域材料中進行研究，掌握確切證據與釐清現象的重要工具。本課程主要建構於繞射學、顯微術以及光譜學 三大基礎，旨在闡釋固態材料內部與表面的晶體結構、顯微結構以及成分、鍵結等之分析技術。本課程將逐步剖析X光繞射 儀、穿透式電子顯微鏡、光學及電子顯微鏡、歐傑電子能譜儀、化學分析電子光譜儀、二次離子質譜儀，以及各式光譜儀 等，了解不同技術所對應的分析原理與分析尺度;。在課程中都將有實例介紹，並解釋如何分析數據，課程中也將安排分組 報告，使學生得以了解並深入各種常見的材料分析應用。本學期採英語授課。 Materials Analysis is constructed by Microscopy, Diffraction, and Chemistry Analysis, which focuses on the inside and surface of solid materials on morphology, structure, and composition characterization. In this semester, the course contains those techniques such as Scanning electron microscopy (SEM), Transmission electron microscopy (TEM), X-ray Diffraction (XRD), X-ray microanalysis (EDS/WDS), Scanning probe microscopy (SPM), Auger electron spectroscopy (AES), X-ray photoelectron

Description

Course keywords: 繞射學、顯微術、光譜學、表面分析、材料分析 diffractometry, microscopy, spectrum, surface analysis, materials analysis 一、課程說明(Course Description) 材料分析為各領域材料中進行研究，掌握確切證據與釐清現象的重要工具。本課程主要建構於繞射 學、顯微術以及光譜學三大基礎，旨在闡釋固態材料內部與表面的晶體結構、顯微結構以及成分、 鍵結等之分析技術。本課程將逐步剖析X光繞射儀、穿透式電子顯微鏡、光學及電子顯微鏡、歐傑 電子能譜儀、化學分析電子光譜儀、二次離子質譜儀，以及各式光譜儀等，了解不同技術所對應的 分析原理與分析尺度;。在課程中都將有實例介紹，並解釋如何分析數據，課程中也將安排分組 報告，使學生得以了解並深入各種常見的材料分析應用。此課程適合大三以上或欲進行專題實作學生。 Materials Analysis is constructed by Microscopy, Diffraction, and Chemistry Analysis, which focuses on the inside and surface of solid materials on morphology, structure, and composition characterization. In this semester, the course contains those techniques such as Scanning electron microscopy (SEM), Transmission electron microscopy (TEM), X-ray Diffraction (XRD), X-ray microanalysis (EDS/WDS), Scanning probe microscopy (SPM), Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS/ESCA), and Secondary ion mass spectroscopy (SIMS). Develops analytical skills to strengthen research ability for independent studies with an integrated approach that combines techniques, principals and implementation perspectives. 二、指定用書(Text Books) 三、參考書籍(References) Goldstein, Joseph I., et al. Scanning electron microscopy and X-ray microanalysis. Springer. Williams, D. B., & Carter, C. B. Transmission electron microscopy: a textbook for materials science. Springer. Cullity, B. D., & Stock, S. R. Elements of x-ray diffraction, Prentice Hall. Vickerman, J. C., & Gilmore, I. S. Surface analysis: the principal techniques. John Wiley & Sons. 汪建民主編，“材料分析”，第二版，中國材料科學學會出版。 四、教學方式(Teaching Method) 上課將使用投影片搭配課本於課堂講授。課程進行中每個單元會有實例演練，並練習如何分析數 據。學期末修課同學將須選擇一主題做資料探索並提出分組報告。 Lecture Handouts will be uploaded to Teams channel. Announcement: EEClass Online Class Platform: Teams 五、教學進度(Syllabus) Chapter 0. 材料分析簡介 Materials Analysis Overview Chapter 1. 顯微術分析-光學與掃描式電子顯微鏡 Microscopy: SEM Chapter 2. 顯微術分析-搭載分析技術 Microscopy: EDS/WDS, EPMA Chapter 3. 晶體結構分析-Crystal Structure: XRD Chapter 4. 顯微術分析-穿透式電子顯微鏡 Crystal Structure/Microscopy: TEM, FIB Chapter 5. 表面分析-Surface Analysis: SPM (STM, AFM) Chapter 6. 表面分析-Surface Analysis: AES Chapter 7. 表面分析-Surface Analysis: XPS(ESCA) Chapter 8. 表面分析-Surface Analysis: SIMS Chapter 9. 顯微術分析-Atomic Probe Tomography 六、成績考核(Evaluation) 1. 小考 Quiz (48%) 2. 課堂表現與討論 Course performance (Group activities) (20%) 3. 期末報告 Report and oral presentation (20%) 4. 作業 Homework (12%)

Timetable

Scores

Average GPA 3.81

Std. Deviation 0.41

Remarks

Restrictions

Compulsory

Elective

Cross Discipline

First Specialization

Second Specialization